ROHS detector analysis steps - Database & Sql Blog Articles

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As a mandatory standard for EU legislation to develop the most stringent health product standards, ROHS detectors are required by most companies. Everything in life may be related to it, but how do people pass?

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The analysis of the ROHS detector is an X-ray fluorescence spectrometer, and its analysis is also the analysis of the X-ray fluorescence spectrometer. X-ray fluorescence spectrometers can be divided into two major categories, wavelength dispersive X-ray fluorescence spectrometer (WDXRF) and energy dispersive X-ray fluorescence spectrometer (EDXRF). The components of the wavelength dispersive spectrometer include excitation source, spectroscopic crystal and goniometer, and detection. The energy dispersive spectrometer only needs to excite the source and detector and the dry electronics and control components, relatively large. The wavelength dispersive X-ray fluorescence spectrometer uses the analytical crystal to distinguish the analytical line of the element to be tested. According to Bragg's law, the angle of the element to be measured can be obtained by measuring the angle: λ=2dsinaθ(n=1,2,3 In the formula, λ is the wavelength of the analysis line; d is the lattice spacing of the crystal; θ is the diffraction angle; n is the diffraction order. With the goniometer, it is possible or perhaps possible to measure the diffraction angle of the analytical line. Using the above formula, it is possible or perhaps to designate the wavelength of the corresponding element to obtain the characteristic information of the element to be tested. The energy color scatter fluorescence spectrometer uses an energy detector to measure the amount of charge collected by the detector and directly obtain the characteristic ray energy emitted by the measured element: Q=kE where K is the photon energy of the incident ray; Q The corresponding amount of charge generated for the detector; k is the corresponding parameter for different types of energy detectors. The amount of charge is proportional to the incident ray energy, so the amount of charge is measured by the process to obtain the characteristic information of the element to be tested. The characteristic line of the element to be tested needs to be obtained by using a certain excitation source. At present, the excitation source conventionally used is a ray tube and an isotope excitation source. In order to obtain qualitative and quantitative information of the sample, in addition to the spectrometer, certain sample preparation skills must be used, and the obtained spectrum of intensity analysis and data processing are completed.

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